Comment 14 for bug 1852510

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Brian Murray (brian-murray) wrote : Re: IO errors when writing large amounts of data to USB storage in eoan on RPI

Dave in comment #10 you said "load on the ARM during transfers (my hunch is, if anything is affected, it'll be the latter - I vaguely recall forum posts about improvements on the ARM load during large USB transactions)." Were the systems checked for load during the transfer tests?

Additionally, would it be worthwhile to test different versions of USB media? I'd really hate to be caught off guard by something.